Measurement Technology
Principles of Thickness Measurement Using Tunable Lasers
Detailed explanation of the basic principles of thickness measurement using tunable lasers in LSI-TG, along with interference fringe analysis methods.
Technical Blog
Sharing information and knowledge about measurement technology
TAMON's technical blog delivers various information about measurement,
including principles and technologies of optical measurement systems and implementation know-how.
Technical Explanation
Challenges and Solutions in Measuring High-doped Si Wafers
Explaining why measuring high-concentration dopant samples like P++ is difficult, and our proprietary surface reflection cancellation technology.
Measurement Technology
Key Points for Light Source Selection in Spectral Measurement
Comparing characteristics of laser and white light sources, explaining optimal light source selection based on application.
Product Information
In-plane Distribution Measurement with Hyperspectral Cameras
Detailed explanation of the hyperspectral camera mechanism used in FALCO and differences from conventional point measurement.
Measurement Technology
Importance of Wavelength Resolution in Thin Film Measurement
Explaining the theoretical background of why wide wavelength range is necessary when measuring thin films below 10μm.
Implementation Case
Best Practices for Integrating Measurement Systems into Production Lines
Introducing design philosophy and PLC integration know-how when incorporating measurement systems into actual production lines.
Main Technical Topics
Spectral Measurement
- Tunable Lasers
- White Light Sources
- Spectrometer Selection
- Spectrum Analysis
Thickness Measurement
- Interference Fringe Analysis
- Multilayer Measurement
- Thin Film Measurement
- Thick Sample Measurement
System Design
- Optical Design
- PLC Integration
- Automation Systems
- Customization
Technical Consultation
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Please feel free to contact us.