LSU-C01S04
Light Source Unit
High-performance LED and control board in a palm-sized housing.
First packaged product developed leveraging over 30 years of spectral analysis experience.
Product Images
Relative Intensity Spectral Distribution (Company A Spectrometer)
Relative intensity spectral distribution measured with a 500nm blazed wavelength Company A spectrometer.
Relative Intensity Spectral Distribution (Company O Spectrometer)
Relative intensity spectral distribution measured with a 500nm blazed wavelength Company O spectrometer.
TAMON Co., Inc., which has long been engaged in spectral analysis with a focus on custom projects and factory production/shipping inspections, has begun offering a light source unit as its first packaged product based on materials developed for delivery, leveraging over 30 years of experience in this field.
LSU-C01S04 packs high-performance LED and control board into a palm-sized housing, allowing you to easily try out a stable light source with low heat generation.
It can be used as a stable light source in a wide range of applications, including construction of spectral measurement systems, integration into inspection equipment, and research and development applications.
Features
Compact Housing
Palm-sized compact design, installable in various environments.
High-performance LED
Uses high-quality LED elements to achieve stable light output.
Low Heat Design
Efficient heat dissipation design enables long-term continuous use.
Stable Light Output
Maintains stable light intensity over long periods.
Built-in Control Board
Built-in control circuit allows use with simple connections.
Easy Implementation
As a packaged product, you can start using it immediately.
Product Leveraging Over 30 Years of Spectral Analysis Experience
TAMON Co., Inc. has long been engaged in spectral analysis with a focus on custom projects and factory production/shipping inspections.
Leveraging over 30 years of experience in this field, we have begun offering a light source unit as our first packaged product based on materials developed for delivery. It is a highly reliable product backed by years of proven track record.
Actual Measurement Screen Example
This is the screen showing simultaneous measurement of the active layer and box layer of an SOI wafer using LSU-C01S04 as the light source. The trend graph (time variation of measured thickness) in the lower right shows no disturbance, demonstrating that even samples with strict thick-layer conditions can be measured. This shows that the light source spectrum is more stable compared to halogen lamps.
Main Applications
Spectral Measurement
- Light source for spectral measurement systems
- Transmittance/reflectance measurement
- Absorbance measurement
Inspection Equipment
- Integration into inspection equipment
- Quality control systems
- In-line inspection
Research & Development
- R&D light source
- Integration into experimental equipment
- Prototype development
Educational Applications
- Educational experimental equipment
- Demonstrations
- Learning systems
Packaged Product Benefits
Ready to Use
Packaged for immediate use upon arrival
Proven Technology
Highly reliable product based on over 30 years of spectral analysis experience
Cost Performance
Packaging enables cost-effective offering
Inquiries about LSU-C01S04
For detailed specifications, pricing, delivery time, and other information,
please feel free to contact us.