Products
Product lineup centred on optical measurement systems
Measurement Systems
Non-contact, non-destructive optical thickness measurement systems
LSI-TG
Tunable Laser Thickness Measurement System
Measures targets from distances exceeding 1 metre in real time. Ideal for integration into production lines.
WSI-TG
White Light Source Thickness Measurement System
Compact design optimised for short-distance measurement. Suitable for benchtop and portable use.
FALCO
Hyperspectral Camera Thickness Measurement System
Measures in-plane thickness distribution across an entire sample. Proven track record in SOI wafer outgoing inspection.
Light Source
Light source units for spectral measurement and inspection equipment
LSU-C01S04
Light Source Unit
Palm-sized housing with high-performance LED and integrated control board. Low heat generation for stable light output.
Software
Analysis software to enhance optical measurement capabilities
TAMTEC PEAK ANALYZER
Spectral Peak & FWHM Analysis Software
Specialist analysis software for USB spectrometers. Real-time FWHM calculation, automatic multi-peak detection, and Gaussian/Lorentz fitting supported.
Demonstration & Evaluation
We accommodate demonstration requests to the extent possible.
The WSI-TG-based measurement system is available for loan due to its compact size.
For the larger LSI-TG and FALCO systems, measurements can be conducted
with samples brought to our facility or loaned to us.