WSI-TG
White Light Source Thickness Measurement System
Point spectroscopy thickness measurement system using white light source and spectrometer.
Compact and suitable for short-distance measurement, compatible with tabletop and portable measurement.
WSI-TG is a point spectroscopy thickness measurement system using white light source and spectrometer. It measures thickness changes in real-time and is often integrated into production lines.
Like LSI-TG, non-contact and non-destructive measurement is possible, minimizing impact on samples by using light as the measurement medium. It excels at short-distance measurement and the entire system is compact. In addition to equipment integration, it is also suitable for tabletop measurement and portable measurement.
With a broader measurement wavelength range than LSI-TG, it supports thin film measurements of 10μm or less in Si-equivalent. It is optimal for measuring thin objects such as coating layers.
Features
Compact Design
The entire system is compact and requires minimal installation space.
Short-distance Measurement
Excels at short-distance measurement, usable in sealed environments and narrow spaces.
Tabletop & Portable Compatible
Flexible enough to be used as a tabletop or portable measurement device.
Wide Wavelength Range
Wide usable wavelength range supports thin to thick films.
Thin Film Measurement Capable
Can measure thin samples below 10μm in Si-equivalent.
Non-contact & Non-destructive
Light-based measurement causes no damage to samples.
Differences from LSI-TG
Measurement Distance and System Size
WSI-TG
- •Excels at short-distance measurement
- •Entire system is compact
- •Suitable for tabletop and portable measurement
LSI-TG
- •Measures from 1m+ distance
- •Optical axis adjustment fixture is somewhat large
- •Mainly for production equipment integration
Measurement Targets and Strengths
WSI-TG
- •Wide wavelength range enables thin film measurement
- •Supports below 10μm Si-equivalent
- •Optimal for thin objects such as coating layers
LSI-TG
- •Strong penetration power excels at thick sample measurement
- •High wavelength resolution
- •Targets 10μm+ Si-equivalent
Main Applications
Demo Equipment Rental Available
The relatively compact WSI-TG-based measurement environment can be loaned out.
If you are looking for thin film measurement or a compact system, please feel free to contact us.