Precision Measurement Technology
for Advanced Manufacturing

TAMON Co., Inc. has been dedicated to precision measurement for over 30 years. Specializing in silicon wafer thickness measurement, we provide customized measurement systems tailored to our customers' needs.

Our Expertise

01

Over 30 Years of Experience

Established expertise in optical measurement technology with a proven track record of delivering solutions to challenging measurement requirements.

02

Flexible Customization

We adapt our systems to your specific production environment, including customized communication protocols and measurement parameters.

03

High-Precision Measurement

Optical sensor-based high-precision measurement contributes to improving product quality.

Product Lineup

Optical measurement systems engineered to meet the demanding requirements of modern semiconductor and precision manufacturing.

Measurement Systems

Non-contact, non-destructive optical thickness measurement systems

LSI-TG

Tunable Laser Thickness Measurement System

Measures targets from distances exceeding 1 metre in real time. Ideal for integration into production lines.

Non-contact & non-destructive
Long-distance measurement
Thousands of measurements per second
Highly-doped Si compatible
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WSI-TG

White Light Source Thickness Measurement System

Compact design optimised for short-distance measurement. Suitable for benchtop and portable use.

Compact design
Short-distance measurement
Broad wavelength range
Thin film measurement
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FALCO

Hyperspectral Camera Thickness Measurement System

Measures in-plane thickness distribution across an entire sample. Proven track record in SOI wafer outgoing inspection.

In-plane distribution measurement
High-speed measurement
SOI wafer inspection
Large-scale system compatible
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Light Source

Light source units for spectroscopic measurement and inspection systems

LSU-C01S04

Light Source Unit

Palm-sized housing with high-performance LED and integrated control board. Low heat generation for stable light output.

Compact housing
High-performance LED
Low heat generation
Stable light output
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Software

Analysis software to enhance optical measurement capabilities

TAMTEC PEAK ANALYZER

Spectral Peak & FWHM Analysis Software

Specialist analysis software for USB spectrometers. Real-time FWHM calculation, automatic multi-peak detection, and Gaussian/Lorentz fitting supported.

Real-time FWHM display
Automatic multi-peak detection
CSV data export
Gaussian / Lorentz fitting
Pseudo-Voigt fitting
Stark width measurement
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Applications & Industries

Semiconductor

Silicon wafer thickness measurement and SOI wafer inspection

Automotive

Precision component measurement for automotive manufacturing

Research

Laboratory measurement systems for academic and industrial R&D

Production Lines

Integrated measurement solutions for automated manufacturing

Discuss Your Measurement Requirements

We offer demonstration equipment loans and measurement sample services to help you evaluate our solutions.

Contact Our Team