WSI-TG
White Light Source Thickness Measurement System
Point spectroscopy thickness measurement system using white light source and spectrometer.
Compact and suitable for short-distance measurement, compatible with tabletop and portable measurement.
WSI-TG is a point spectroscopy thickness measurement system using white light source and spectrometer. It measures thickness changes in real-time and is often integrated into production lines.
With a broader measurement range than the LSI-TG, it supports thin film measurements of 10 µm or less (Si equivalent). It is ideal for measuring thin layers such as coatings.
The usable wavelength range is wide, enabling measurement of thin samples. Compared to LSI-TG, the wavelength variation range is broader, supporting thin film measurement below 10μm in Si-equivalent. It is optimal for measuring thin objects such as coating layers.
Features
Compact Design
The entire system is compact and requires minimal installation space.
Short-distance Measurement
Excels at short-distance measurement, usable in sealed environments and narrow spaces.
Tabletop & Portable Compatible
Flexible enough to be used as a tabletop or portable measurement device.
Wide Wavelength Range
Wide usable wavelength range supports thin to thick films.
Thin Film Measurement Capable
Can measure thin samples below 10μm in Si-equivalent.
Non-contact & Non-destructive
Light-based measurement causes no damage to samples.
Differences from LSI-TG
Measurement Distance and System Size
WSI-TG
- •Excels at short-distance measurement
- •Entire system is compact
- •Suitable for tabletop and portable measurement
LSI-TG
- •Measures from 1m+ distance
- •Optical axis adjustment fixture is somewhat large
- •Mainly for production equipment integration
Measurement Targets and Strengths
WSI-TG
- •Wide wavelength range enables thin film measurement
- •Supports below 10μm Si-equivalent
- •Optimal for thin objects such as coating layers
LSI-TG
- •Strong penetration power excels at thick sample measurement
- •High wavelength resolution
- •Targets 10μm+ Si-equivalent
Main Applications
Demo Equipment Rental Available
The relatively compact WSI-TG-based measurement environment can be loaned out.
If you are looking for thin film measurement or a compact system, please feel free to contact us.