Precision Measurement Technology
for Advanced Manufacturing

TAMON Co., Inc. has been dedicated to precision measurement for over 30 years. Specializing in silicon wafer thickness measurement, we provide customized measurement systems tailored to our customers' needs.

Our Expertise

01

Over 30 Years of Experience

Established expertise in optical measurement technology with a proven track record of delivering solutions to challenging measurement requirements.

02

Flexible Customization

We adapt our systems to your specific production environment, including customized communication protocols and measurement parameters.

03

High-Precision Measurement

Optical sensor-based high-precision measurement contributes to improving product quality.

Product Portfolio

Optical measurement systems engineered to meet the demanding requirements of modern semiconductor and precision manufacturing.

LSI-TG

Tunable Laser Thickness Measurement System

Non-contact measurement from distances exceeding 1 metre. Ideal for integration into production lines with high-speed, high-precision thickness measurement capabilities.

Non-contact & non-destructive
Long-distance measurement
Thousands of measurements per second
Highly-doped Si compatible
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WSI-TG

White Light Source Thickness Measurement System

Compact design optimised for short-distance measurements. Suitable for benchtop instruments and portable applications.

Compact design
Short-distance measurement
Broad wavelength range
Thin film measurement
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FALCO

Hyperspectral Thickness Measurement System

Full-surface thickness distribution measurement. Optimised for SOI wafer inspection and quality control.

In-plane distribution measurement
High-speed operation
SOI wafer inspection
Large-scale system capability
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LSU-C01S04

Light Source Unit

Palm-sized housing with high-performance LED and integrated control board. Low heat generation ensures stable light output.

Compact housing
High-performance LED
Low heat generation
Stable light source
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Applications & Industries

Semiconductor

Silicon wafer thickness measurement and SOI wafer inspection

Automotive

Precision component measurement for automotive manufacturing

Research

Laboratory measurement systems for academic and industrial R&D

Production Lines

Integrated measurement solutions for automated manufacturing

Discuss Your Measurement Requirements

We offer demonstration equipment loans and measurement sample services to help you evaluate our solutions.

Contact Our Team