Products
Optical measurement systems engineered for precision manufacturing and quality control
LSI-TG
Tunable Laser Thickness Measurement System
Non-contact, non-destructive thickness measurement system utilising tunable laser technology. Capable of measuring objects from distances exceeding 1 metre, making it ideal for integration into production lines.
Key Features
Applications
WSI-TG
White Light Source Thickness Measurement System
Point spectroscopy thickness measurement system using white light source and spectrometer. Compact design suited for short-distance measurements, benchtop instruments, and portable applications.
Key Features
Applications
FALCO
Hyperspectral Camera Thickness Measurement System
Optical measurement system for full-surface imaging and in-plane thickness distribution measurement. Proven track record in SOI silicon wafer outgoing inspection and pre-dicing inspection of patterned wafers.
Key Features
Applications
LSU-C01S04
Light Source Unit
Compact light source unit with high-performance LED and integrated control board in a palm-sized housing. First packaged product developed from over 30 years of spectroscopic analysis experience.
Key Features
Applications
Demonstration & Evaluation
We accommodate demonstration requests to the extent possible. The WSI-TG-based measurement system is available for loan due to its relatively compact size. For the larger LSI-TG and FALCO systems, measurements can be conducted with samples brought to our facility or loaned to us.
Request Demonstration